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Exp 13 (1900290130025)
Exp 13 (1900290130025)Exp 13 (1900290130025)
Exp 13 (1900290130025)11(NOR)(1900290130025)AMAN VERMA
11(NOR)(1900290130025)AMAN VERMAExp 3
Exp 31900290130025 Aman Verma (6)
1900290130025 Aman Verma (6)(10) AMAN VERMA 1900290130025
(10) AMAN VERMA 1900290130025AMAN VERMA (1900290130025)
AMAN VERMA (1900290130025)(12) 1900290130025 Aman Verma
(12) 1900290130025 Aman VermaExp 16 AMAN VERMA
Exp 16 AMAN VERMAEXP 17 SHift right using D
EXP 17 SHift right using DEXP 17 (Univesal Register)
EXP 17 (Univesal Register)EXP 4
EXP 4(8) AMAN VERMA 1900290130025
(8) AMAN VERMA 1900290130025(9) AMAN VERMA 1900290130025
(9) AMAN VERMA 1900290130025exp 5
exp 511(NAND)(1900290130025)AMAN VERMA
11(NAND)(1900290130025)AMAN VERMAExp 15 AMAN VERMA
Exp 15 AMAN VERMA(10) AMAN VERMA 1900290130025
(10) AMAN VERMA 190029013002511a(1900290130025)AMAN VERMA
11a(1900290130025)AMAN VERMAEXP 17 shift left using D
EXP 17 shift left using DAnsh Sawant Practical Exam
Ansh Sawant Practical Examexperiment -11 SR latch with NAND
experiment -11 SR latch with NANDSequential circuit to detect 3 or more 1 in the input
Sequential circuit to detect 3 or more 1 in the input(10) AMAN VERMA 1900290130025
(10) AMAN VERMA 1900290130025